phoenix|x-ray wins Global Technology Award 2006

NewsSouth-East European INDUSTRIAL Мarket - issue 1/2007

phoenix|x-ray announced that it has been awarded the coveted Global Technology Award 2006 in the category “Best Inspection/X-ray system” for its novel 160kV nanofocus computed tomography system nanotom. The award was presented by Global SMT & Packaging Magazine during Assembly Technology Expo in Rosemont, Chicago. The independent panel of international experts from industry and research chose the nanotom for its high degree of technical innovation and outstanding ease-of-use.

The nanotom is the first 160 kV nanofocus computed tomography system ever to cater specifically to applications in sensorics, materials science, electronics and the semiconductor industry. The nanotom enables the analysis of internal structures of complex electronic devices at highest resolutions.




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